Browsing [article] Sähkötekniikan korkeakoulu / ELEC by Author "Inglese, Alessandro"

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Title: Accelerated light-induced degradation for detecting copper contamination in p-type silicon Author(s): Inglese, Alessandro; Lindroos, Jeanette; Savin, Hele Date: 2015 Series: Applied Physics Letters, Volume 107, Issue 5 School of Electrical Engineering
Title: Reduction of Light-induced Degradation of Boron-doped Solar-grade Czochralski Silicon by Corona Charging Author(s): Boulfrad, Yacine; Lindroos, Jeanette; Inglese, Alessandro; Yli-Koski, Marko; Savin, Hele Date: 2013 Series: Energy Procedia, Volume 38 School of Electrical Engineering